TY  - RPRT
TI  - From randomized benchmarking experiments to gateset circuit fidelity: how to interpret randomized benchmarking decay parameters
AU  - Arnaud Carignan-Dugas
AU  - Kristine Boone
AU  - Joel J. Wallman
AU  - Joseph Emerson
PY  - 2018
DO  - 10.1088/1367-2630/aadcc7
UR  - https://arxiv.org/abs/1804.01122
ID  - 1804.01122
ER  -