TY  - RPRT
TI  - Experimental TDPAC and Theoretical DFT Study of Structural, Electronic, and Hyperfine Properties in ($^{111}$In-->) $^{111}$Cd-Doped SnO$_2$ Semiconductor: Ab Initio Modeling of the Electron-Capture-Decay After-Effects Phenomenon
AU  - Germán N. Darriba
AU  - Emiliano L. Muñoz
AU  - Artur W. Carbonari
AU  - Mario Rentería
PY  - 2018
DO  - 10.1021/acs.jpcc.8b03724
UR  - https://arxiv.org/abs/1804.02786
ID  - 1804.02786
ER  -