TY  - RPRT
TI  - Large thickness dependence of the carrier mobility in a transparent oxide semiconductor, La-doped BaSnO3
AU  - Anup V. Sanchela
AU  - Mian Wei
AU  - Haruki Zensyo
AU  - Bin Feng
AU  - Joonhyuk Lee
AU  - Gowoon Kim
AU  - Hyoungjeen Jeen
AU  - Yuichi Ikuhara
AU  - Hiromichi Ohta
PY  - 2018
DO  - 10.1063/1.5033326
UR  - https://arxiv.org/abs/1804.05344
ID  - 1804.05344
ER  -