TY  - RPRT
TI  - Electrically Benign Defect Behavior in Zinc Tin Nitride Revealed from First Principles
AU  - Naoki Tsunoda
AU  - Yu Kumagai
AU  - Akira Takahashi
AU  - Fumiyasu Oba
PY  - 2018
DO  - 10.1103/physrevapplied.10.011001
UR  - https://arxiv.org/abs/1804.09357
ID  - 1804.09357
ER  -