TY  - RPRT
TI  - On the Validity and Applicability of Models of Negative Capacitance and Implications for MOS Applications
AU  - J. A. Kittl
AU  - B. Obradovic
AU  - D. Reddy
AU  - T. Rakshit
AU  - R. M. Hatcher
AU  - M. S. Rodder
PY  - 2018
DO  - 10.1063/1.5036984
UR  - https://arxiv.org/abs/1805.01145
ID  - 1805.01145
ER  -