TY  - RPRT
TI  - Surface analysis via fast atom diffraction: pattern visibility and spot-beam contribution
AU  - L. Frisco
AU  - J. E. Miraglia
AU  - M. S. Gravielle
PY  - 2018
UR  - https://arxiv.org/abs/1805.01524
ID  - 1805.01524
ER  -