@misc{indiciaeb28f8c5283b6,
  title = {Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor},
  author = {Ke Chen and Xianghai Meng and Feng He and Yongjian Zhou and Jihoon Jeong and Nathanial Sheehan and Seth R Bank and Yaguo Wang},
  year = {2018},
  url = {https://arxiv.org/abs/1805.01561},
  note = {Source identifier: 1805.01561}
}