TY  - RPRT
TI  - Comparison between Grating Imaging and Transient Grating Techniques on Measuring Carrier Diffusion in Semiconductor
AU  - Ke Chen
AU  - Xianghai Meng
AU  - Feng He
AU  - Yongjian Zhou
AU  - Jihoon Jeong
AU  - Nathanial Sheehan
AU  - Seth R Bank
AU  - Yaguo Wang
PY  - 2018
UR  - https://arxiv.org/abs/1805.01561
ID  - 1805.01561
ER  -