@misc{indiciae2723ae3982ca,
  title = {Structural and electrical characterization of NbO2 thin film vertical devices grown on TiN-coated SiO2/Si substrates},
  author = {Toyanath Joshi and Pavel Borisov and David Lederman},
  year = {2018},
  doi = {10.1063/1.5038837},
  url = {https://arxiv.org/abs/1805.02353},
  note = {Source identifier: 1805.02353}
}