TY  - RPRT
TI  - Structural and electrical characterization of NbO2 thin film vertical devices grown on TiN-coated SiO2/Si substrates
AU  - Toyanath Joshi
AU  - Pavel Borisov
AU  - David Lederman
PY  - 2018
DO  - 10.1063/1.5038837
UR  - https://arxiv.org/abs/1805.02353
ID  - 1805.02353
ER  -