TY  - RPRT
TI  - Critical-point model dielectric function analysis of WO$_3$ thin films deposited by atomic layer deposition techniques
AU  - Ufuk Kilic
AU  - Derek Sekora
AU  - Alyssa Mock
AU  - Rafal Korlacki
AU  - Elena M. Echeverria
AU  - Natale J. Ianno
AU  - Eva Franke-Schubert
AU  - Mathias M. Schubert
PY  - 2018
DO  - 10.1063/1.5038746
UR  - https://arxiv.org/abs/1805.04171
ID  - 1805.04171
ER  -