TY  - RPRT
TI  - Statistical-Raman-Microscopy and Atomic-Force-Microscopy on Heterogeneous Graphene Obtained after Reduction of Graphene Oxide
AU  - Siegfried Eigler
AU  - Ferdinand Hof
AU  - Michael Enzelberger-Heim
AU  - Stefan Grimm
AU  - Paul Müller
AU  - Andreas Hirsch
PY  - 2018
DO  - 10.1021/jp500580g
UR  - https://arxiv.org/abs/1805.04248
ID  - 1805.04248
ER  -