@misc{indiciaec1fb4622049e,
  title = {Transient Phenomena in Sub-Band Gap Impact Ionization in Si NIPIN Diode},
  author = {Bhaskar Das and J. Schulze and Udayan Ganguly},
  year = {2018},
  doi = {10.1109/ted.2018.2846360},
  url = {https://arxiv.org/abs/1805.07053},
  note = {Source identifier: 1805.07053}
}