TY  - RPRT
TI  - Transient Phenomena in Sub-Band Gap Impact Ionization in Si NIPIN Diode
AU  - Bhaskar Das
AU  - J. Schulze
AU  - Udayan Ganguly
PY  - 2018
DO  - 10.1109/ted.2018.2846360
UR  - https://arxiv.org/abs/1805.07053
ID  - 1805.07053
ER  -