TY  - RPRT
TI  - Analysis of superresolution via 3D structured illumination intensity correlation microscopy
AU  - Anton Classen
AU  - Joachim von Zanthier
AU  - Girish S. Agarwal
PY  - 2018
DO  - 10.1364/oe.26.027492
UR  - https://arxiv.org/abs/1806.00643
ID  - 1806.00643
ER  -