TY  - RPRT
TI  - Cryogenic Characterization of 28 nm Bulk CMOS Technology for Quantum Computing
AU  - Arnout Beckers
AU  - Farzan Jazaeri
AU  - Andrea Ruffino
AU  - Claudio Bruschini
AU  - Andrea Baschirotto
AU  - Christian Enz
PY  - 2018
DO  - 10.1109/essderc.2017.8066592
UR  - https://arxiv.org/abs/1806.01142
ID  - 1806.01142
ER  -