TY  - RPRT
TI  - Comprehensive numerical modeling of filamentary RRAM devices including voltage ramp-rate and cycle-to-cycle variations
AU  - Dipesh Niraula
AU  - Victor Karpov
PY  - 2018
DO  - 10.1063/1.5042789
UR  - https://arxiv.org/abs/1806.01397
ID  - 1806.01397
ER  -