TY  - RPRT
TI  - Achieving High-Fidelity Single-Qubit Gates in a Strongly Driven Charge Qubit with $1\!/\!f$ Charge Noise
AU  - Yuan-Chi Yang
AU  - S. N. Coppersmith
AU  - Mark Friesen
PY  - 2019
DO  - 10.1038/s41534-019-0127-1
UR  - https://arxiv.org/abs/1806.02413
ID  - 1806.02413
ER  -