@misc{indiciae78dd3d2a27d7,
  title = {Full field electron spectromicroscopy applied to ferroelectric materials},
  author = {N. Barrett and J. E. Rault and J. L. Wang and C. Mathieu and A. Locatelli and T. O. Mentes and M. A. Nino and S. Fusil and M. Bibes and A. Barthelemy and D. Sando and W. Ren and S. Prosandeev and L. Bellaiche and B. Vilquin and A. Petraru and I. P. Krug and C. M. Schneider},
  year = {2018},
  doi = {10.1063/1.4801968},
  url = {https://arxiv.org/abs/1806.04849},
  note = {Source identifier: 1806.04849}
}