TY  - RPRT
TI  - Porosity and roughness determination of porous silicon thin films by genetic algorithms
AU  - C. F. Ramirez-Gutierrez
AU  - J. D. Castaño-Yepes
AU  - M. E. Rodriguez-Garcia
PY  - 2018
DO  - 10.1016/j.ijleo.2018.08.019
UR  - https://arxiv.org/abs/1806.06335
ID  - 1806.06335
ER  -