TY  - RPRT
TI  - Understanding the Bias Dependence of Low Frequency Noise in Sin-gle Layer Graphene FETs
AU  - Nikolaos Mavredakis
AU  - Ramon Garcia Cortadella
AU  - Andrea Bonaccini Calia
AU  - Jose A. Garrido
AU  - David Jiménez
PY  - 2018
DO  - 10.1039/c8nr04939d
UR  - https://arxiv.org/abs/1806.06589
ID  - 1806.06589
ER  -