TY  - RPRT
TI  - Gate fidelity comparison in semiconducting spin qubit implementations affected by control noises
AU  - E. Ferraro
AU  - M. Fanciulli
AU  - M. De Michielis
PY  - 2018
DO  - 10.1088/2399-6528/aaf088
UR  - https://arxiv.org/abs/1806.07597
ID  - 1806.07597
ER  -