@misc{indiciae8030e30f5379,
  title = {Experimental verification of electrostatic boundary conditions in gate-patterned quantum devices},
  author = {H. Hou and Y. Chung and G. Rughoobur and T. K. Hsiao and A. Nasir and A. J. Flewitt and J. P. Griffiths and I. Farrer and D. A. Ritchie and C. J. B. Ford},
  year = {2018},
  doi = {10.1088/1361-6463/aac376},
  url = {https://arxiv.org/abs/1806.09143},
  note = {Source identifier: 1806.09143}
}