@misc{indiciae561b72607ef2,
  title = {Advanced Methods for the Optical Quality Assurance of Silicon Sensors},
  author = {E. Lavrik and I. Panasenko and H. R. Schmidt},
  year = {2018},
  doi = {10.1016/j.nima.2018.10.210},
  url = {https://arxiv.org/abs/1807.00211},
  note = {Source identifier: 1807.00211}
}