TY  - RPRT
TI  - Advanced Methods for the Optical Quality Assurance of Silicon Sensors
AU  - E. Lavrik
AU  - I. Panasenko
AU  - H. R. Schmidt
PY  - 2018
DO  - 10.1016/j.nima.2018.10.210
UR  - https://arxiv.org/abs/1807.00211
ID  - 1807.00211
ER  -