@misc{indiciaecc9f42a994f9,
  title = {Single-beam reflection technique for determination of nonlinear-refractive index of thin-film semiconductors using an electrically focus tunable lens},
  author = {Juan Serna and Julián Henao and Edgar Rueda and Abdullatif Hamad and Hernando Garcia},
  year = {2018},
  url = {https://arxiv.org/abs/1807.03752},
  note = {Source identifier: 1807.03752}
}