TY  - RPRT
TI  - Single-beam reflection technique for determination of nonlinear-refractive index of thin-film semiconductors using an electrically focus tunable lens
AU  - Juan Serna
AU  - Julián Henao
AU  - Edgar Rueda
AU  - Abdullatif Hamad
AU  - Hernando Garcia
PY  - 2018
UR  - https://arxiv.org/abs/1807.03752
ID  - 1807.03752
ER  -