@misc{indiciae3f568dc99940,
  title = {Effect of device design on charge offset drift in Si/SiO\$\_2\$ single electron devices},
  author = {Binhui Hu and Erick D. Ochoa and Daniel Sanchez and Justin K. Perron and Neil M. Zimmerman and M. D. Stewart Jr},
  year = {2018},
  doi = {10.1063/1.5048013},
  url = {https://arxiv.org/abs/1807.04342},
  note = {Source identifier: 1807.04342}
}