TY  - RPRT
TI  - Interface roughness, carrier localization and wave function overlap in $c$-plane InGaN/GaN quantum wells: Interplay of well width, alloy microstructure, structural inhomogeneities and Coulomb effects
AU  - Daniel S. P. Tanner
AU  - Joshua M. McMahon
AU  - Stefan Schulz
PY  - 2018
DO  - 10.1103/physrevapplied.10.034027
UR  - https://arxiv.org/abs/1807.05392
ID  - 1807.05392
ER  -