TY  - RPRT
TI  - Thermal interface conductance between aluminum and aluminum oxide: A rigorous test of atomistic level theories
AU  - Murali Gopal Muraleedharan
AU  - Kiarash Gordiz
AU  - Shenghong Ju
AU  - Junichiro Shiomi
AU  - Vigor Yang
AU  - Asegun Henry
PY  - 2018
UR  - https://arxiv.org/abs/1807.06631
ID  - 1807.06631
ER  -