TY  - RPRT
TI  - Dual-Gate Modulation of Carrier Density and Disorder in an Oxide Two-Dimensional Electron System
AU  - Zhuoyu Chen
AU  - Hongtao Yuan
AU  - Yanwu Xie
AU  - Di Lu
AU  - Hisashi Inoue
AU  - Yasuyuki Hikita
AU  - Christopher Bell
AU  - Harold Y. Hwang
PY  - 2018
DO  - 10.1021/acs.nanolett.6b02348
UR  - https://arxiv.org/abs/1807.08345
ID  - 1807.08345
ER  -