@misc{indiciae5ebb986d2b1c,
  title = {Strong randomness criticality in the scratched-XY model},
  author = {Tobias Pfeffer and Zhiyuan Yao and Lode Pollet},
  year = {2018},
  doi = {10.1103/physrevb.99.104514},
  url = {https://arxiv.org/abs/1807.09184},
  note = {Source identifier: 1807.09184}
}