TY  - RPRT
TI  - Strong randomness criticality in the scratched-XY model
AU  - Tobias Pfeffer
AU  - Zhiyuan Yao
AU  - Lode Pollet
PY  - 2018
DO  - 10.1103/physrevb.99.104514
UR  - https://arxiv.org/abs/1807.09184
ID  - 1807.09184
ER  -