@misc{indiciae95994f045900,
  title = {Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiation},
  author = {John Anders and Mathieu Benoit and Saverio Braccini and Raimon Casanova and Hucheng Chen and Kai Chen and Francesco Armando di Bello and Armin Fehr and Didier Ferrere and Dean Forshaw and Tobias Golling and Sergio Gonzalez-Sevilla and Giuseppe Iacobucci and Moritz Kiehn and Francesco Lanni and Hongbin Liu and Lingxin Meng and Claudia Merlassino and Antonio Miucci and Marzio Nessi and Ivan Perić and Marco Rimoldi and D M S Sultan and Mateus Vincente Barreto Pinto and Eva Vilella and Michele Weber and Weihao Wu and Lailin Xu and Ettore Zaffaroni},
  year = {2018},
  doi = {10.1088/1748-0221/13/10/p10004},
  url = {https://arxiv.org/abs/1807.09553},
  note = {Source identifier: 1807.09553}
}