TY  - RPRT
TI  - X-Ray Line Profile Variations during Quasar Microlensing
AU  - Lukas Ledvina
AU  - David Heyrovsky
AU  - Michal Dovciak
PY  - 2018
DO  - 10.3847/1538-4357/aad0f3
UR  - https://arxiv.org/abs/1807.11895
ID  - 1807.11895
ER  -