TY  - RPRT
TI  - Intrinsic defect properties in halide double perovskites for optoelectronic applications
AU  - Tianshu Li
AU  - Xingang Zhao
AU  - Dongwen Yang
AU  - Mao-Hua Du
AU  - Lijun Zhang
PY  - 2018
UR  - https://arxiv.org/abs/1808.05330
ID  - 1808.05330
ER  -