@misc{indiciae3fcf0f6388f1,
  title = {Measurement of thickness of thin film by fitting to the intensity profile of Fresnel diffraction from a nano phase step},
  author = {Ali Motazedifard and S. Dehbod and A. Salehpour},
  year = {2018},
  doi = {10.1364/josaa.35.002010},
  url = {https://arxiv.org/abs/1808.06486},
  note = {Source identifier: 1808.06486}
}