TY  - RPRT
TI  - Thermally Oxidized Two-dimensional TaS2 as a High-\k{appa} Gate Dielectric for MoS2 Field-Effect Transistors
AU  - Bhim Chamlagain
AU  - Qingsong Cui
AU  - Sagar Paudel
AU  - Mark Ming-Cheng Cheng
AU  - Pai-Yen Chen
AU  - Zhixian Zhou
PY  - 2018
UR  - https://arxiv.org/abs/1808.08303
ID  - 1808.08303
ER  -