TY  - RPRT
TI  - Effect of low-temperature annealing on the void-induced microstructure in amorphous silicon: A computational study
AU  - Durga Paudel
AU  - Raymond Atta-Fynn
AU  - David A. Drabold
AU  - Parthapratim Biswas
PY  - 2018
DO  - 10.1088/1742-6596/1252/1/012005
UR  - https://arxiv.org/abs/1808.09119
ID  - 1808.09119
ER  -