@misc{indiciaecd88a30d1998,
  title = {Impurity in low energy Ar+ ion beam is the cause of pattern formation on Si},
  author = {Dipak Bhowmik and Manabendra Mukherjee and Prasanta Karmakar},
  year = {2018},
  url = {https://arxiv.org/abs/1809.00525},
  note = {Source identifier: 1809.00525}
}