@misc{indiciaed1acb68d24da,
  title = {Estimation of the electrical and thermal contact resistances and thermoemf of thermoelectric material-metal transient contact layer due to semiconductor surface rougness},
  author = {P. V. Gorskyi},
  year = {2018},
  url = {https://arxiv.org/abs/1809.02504},
  note = {Source identifier: 1809.02504}
}