@misc{indiciae0ee927974c60,
  title = {General Resolution Enhancement Method in Atomic Force Microscopy (AFM) Using Deep Learning},
  author = {Y. Liu and Q. M. Sun and Dr. W. H. Lu and Dr. H. L. Wang and Y. Sun and Z. T. Wang and X. Lu and Prof. K. Y. Zeng},
  year = {2018},
  url = {https://arxiv.org/abs/1809.03704},
  note = {Source identifier: 1809.03704}
}