TY  - RPRT
TI  - Analytical model for the intensity dependence of 1500 nm to 980 nm upconversion in Er$^{3+}$: a new tool for material characterization
AU  - Jeppe Christiansen
AU  - Harish Lakhotiya
AU  - Emil Eriksen
AU  - Søren P. Madsen
AU  - Peter Balling
AU  - Brian Julsgaard
PY  - 2018
DO  - 10.1063/1.5064409
UR  - https://arxiv.org/abs/1809.03908
ID  - 1809.03908
ER  -