TY  - RPRT
TI  - Characterization and Modeling of 28-nm FDSOI CMOS Technology down to Cryogenic Temperatures
AU  - Arnout Beckers
AU  - Farzan Jazaeri
AU  - Heorhii Bohuslavskyi
AU  - Louis Hutin
AU  - Silvano De Franceschi
AU  - Christian Enz
PY  - 2018
DO  - 10.1016/j.sse.2019.03.033
UR  - https://arxiv.org/abs/1809.09013
ID  - 1809.09013
ER  -