@misc{indiciae663b2e691dae,
  title = {Wafer Quality Inspection using Memristive LSTM, ANN, DNN and HTM},
  author = {Kazybek Adam and Kamilya Smagulova and Olga Krestinskaya and Alex Pappachen James},
  year = {2018},
  url = {https://arxiv.org/abs/1809.10438},
  note = {Source identifier: 1809.10438}
}