TY  - RPRT
TI  - Measurement of the variable surface charge concentration in gallium nitride and implications on device modeling and physics
AU  - E. Ber
AU  - B. Osman
AU  - D. Ritter
PY  - 2019
DO  - 10.1109/ted.2019.2901869
UR  - https://arxiv.org/abs/1810.03101
ID  - 1810.03101
ER  -