@misc{indiciae45df5c24148a,
  title = {Unique thickness-dependent properties of the van der Waals interlayer antiferromagnet \$\textbackslash{}mathrm\{MnBi\_2Te\_4\}\$ films},
  author = {Mikhail M. Otrokov and Igor P. Rusinov and María Blanco-Rey and Martin Hoffmann and Alexandra Yu. Vyazovskaya and Sergey V. Eremeev and Arthur Ernst and Pedro M. Echenique and Andrés Arnau and Evgueni V. Chulkov},
  year = {2018},
  doi = {10.1103/physrevlett.122.107202},
  url = {https://arxiv.org/abs/1810.05289},
  note = {Source identifier: 1810.05289}
}