TY  - RPRT
TI  - Defect identification based on first-principles calculations for deep level transient spectroscopy
AU  - Darshana Wickramaratne
AU  - Cyrus E. Dreyer
AU  - Bartomeu Monserrat
AU  - Jimmy-Xuan Shen
AU  - John L. Lyons
AU  - Audrius Alkauskas
AU  - Chris G. Van de Walle
PY  - 2018
DO  - 10.1063/1.5047808
UR  - https://arxiv.org/abs/1810.05302
ID  - 1810.05302
ER  -