@misc{indiciaee9845fb829b6,
  title = {Identification of Defective Two Dimensional Semiconductors by Multifractal Analysis: The Single-layer \$\{\textbackslash{}rm MoS\_2\}\$ Case Study},
  author = {Reza Shidpour and S. M. S. Movahed},
  year = {2018},
  doi = {10.1016/j.physa.2018.05.078},
  url = {https://arxiv.org/abs/1810.05817},
  note = {Source identifier: 1810.05817}
}