TY  - RPRT
TI  - Identification of Defective Two Dimensional Semiconductors by Multifractal Analysis: The Single-layer ${\rm MoS_2}$ Case Study
AU  - Reza Shidpour
AU  - S. M. S. Movahed
PY  - 2018
DO  - 10.1016/j.physa.2018.05.078
UR  - https://arxiv.org/abs/1810.05817
ID  - 1810.05817
ER  -